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Benchmarking ideal sample thickness in cryo-EM using MicroED | ResearchHub
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Benchmarking ideal sample thickness in cryo-EM using MicroED
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Authors
Michael Martynowycz
4 more
Michael Martynowycz
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Max Clabbers
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Tamir Gonen
Published
July 3, 2021
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Topics
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DOI
10.1101/2021.07.02.450941
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cc-no
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Support the authors with ResearchCoin
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Preprint Server
Topics
Biology
Materials Science
Computer Science
Physics
Chemistry
Show all topics
DOI
10.1101/2021.07.02.450941
License
cc-no
