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The effect of the displacement damage on the Charge Collection Efficiency in Silicon Drift Detectors for the LOFT satellite

Authors

E. Del Monte,Y. Evangelista

E. Bozzo,F. Cadoux,A. Rachevski,G. Zampa,N. Zampa,M. Feroci,M. Pohl,A. Vacchi,Ettore Del Monte,Andrea Vacchi,Marco Feroci

+11 authors

,Yuri Evangelista

Journal

Published

Mar 26, 2015

DOI

10.1088/1748-0221/10/05/P05002

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