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Single particle cryo-electron microscopy with an enhanced... | ResearchHub
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Single particle cryo-electron microscopy with an enhanced 200 kV cryo-TEM configuration achieves near-atomic resolution
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Authors
Lijia Jia
6 more
Lijia Jia
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Lijia Jia
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Elizabeth Wasmuth
Published
May 10, 2024
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Topics
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DOI
10.1101/2024.05.07.593029
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cc-no
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Topics
Biology
Materials Science
Computer Science
Physics
Artificial Intelligence
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DOI
10.1101/2024.05.07.593029
License
cc-no
