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Reference Twice: A Simple and Unified Baseline for Few-Sh... | ResearchHub
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Reference Twice: A Simple and Unified Baseline for Few-Shot Instance Segmentation
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Authors
Yue Han
•
Jiangning Zhang
5 more
•
Ming–Hsuan Yang
Published
January 1, 2024
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Journal
IEEE Transactions on Pattern Analysis and Machine Intelligence
Topics
Computer Science
Artificial Intelligence
Chemistry
Organic Chemistry
Computer Vision
Show all topics
DOI
10.1109/tpami.2024.3421340
