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Assessing the SCAN functional for deep defects and small ... | ResearchHub
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Assessing the SCAN functional for deep defects and small polarons in wide band gap semiconductors and insulators
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Authors
Darshana Wickramaratne
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Darshana Wickramaratne
•
John Lyons
Published
June 3, 2024
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Journal
Physical review. B./Physical review. B
Topics
Physics
Materials Science
Quantum Mechanics
Materials Chemistry
Electronic, Optical And Magnetic Materials
Show all topics
DOI
10.1103/physrevb.109.245201
