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Direct Detection System for Full-Field Nanoscale X-ray Di... | ResearchHub
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Direct Detection System for Full-Field Nanoscale X-ray Diffraction-Contrast Imaging
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Authors
Elliot Kisiel
11 more
Elliot Kisiel
•
Ishwor Poudyal
9 more
•
Zahir Islam
Published
May 27, 2024
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Journal
Optics Express
Topics
Physics
Materials Science
Optics
Materials Chemistry
Atomic And Molecular Physics, And Optics
Show all topics
DOI
10.1364/oe.518974
License
CC-BY
Supporters
Support the authors with ResearchCoin
Tip RSC
Journal
Optics Express
Topics
Physics
Materials Science
Optics
Materials Chemistry
Atomic And Molecular Physics, And Optics
Show all topics
DOI
10.1364/oe.518974
License
CC-BY
