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Ensemble Bayesian Network for root cause analysis of prod... | ResearchHub
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Ensemble Bayesian Network for root cause analysis of product defects via learning from historical production data
0
Authors
Karen Wang
2 more
Karen Wang
•
Chao Liu
•
Yuqian Lu
Published
June 14, 2024
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Journal
Journal of Manufacturing Systems
Topics
Computer Science
Machine Learning
Mathematics
Engineering
Economics
Show all topics
DOI
10.1016/j.jmsy.2024.06.001
License
CC-BY-NC-ND
Supporters
Support the authors with ResearchCoin
Tip RSC
Journal
Journal of Manufacturing Systems
Topics
Computer Science
Machine Learning
Mathematics
Engineering
Economics
Show all topics
DOI
10.1016/j.jmsy.2024.06.001
License
CC-BY-NC-ND
