Abstract

Irradiation of high-temperature superconductor YBa2Cu3O7 (YBCO) with high-energy He+ ions is known to cause structural changes in the YBCO film, decreasing the critical temperature TC and finally leading to a superconductor-to-insulator transition. This allows one to pattern narrow insulating regions with a focused ion beam (FIB) and thus fabricate nanoscale Josephson junctions on YBCO films. Moreover, such ion irradiation is known to cause structural changes in the YBCO film. However, details of how these structural changes occur in nanoscale devices produced by FIB remain unknown. Using nanofocus X-ray diffraction, we study the changes in the YBCO crystal lattice and investigate how the nature of these changes depends on the size of the irradiated regions. These data provide an important understanding of how oxide superconductors can be tailored at the nanometer scale for various applications.