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Enhanced Prediction of Semiconductor Wafer Defects throug... | ResearchHub
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Enhanced Prediction of Semiconductor Wafer Defects through CNN Forest Fusion and Random Methods for Improved Efficiency
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Authors
Savita Rawat
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Savita Rawat
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Deepak Banerjee
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Vijay Singh
Published
May 16, 2024
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Topics
Computer Science
Materials Science
Artificial Intelligence
Industrial And Manufacturing Engineering
Electrical And Electronic Engineering
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DOI
10.1109/amathe61652.2024.10582061
