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An Optimized Deep Learning for Efficient Defect Inspectio... | ResearchHub
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An Optimized Deep Learning for Efficient Defect Inspection in Smart Industry with Fog Computing
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Authors
Potu Narayana
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Potu Narayana
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K Keerthi
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•
K. Ghamya
Published
May 17, 2024
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Topics
Computer Science
Artificial Intelligence
Industrial And Manufacturing Engineering
Internet Of Things
Fog Computing
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DOI
10.1109/icdsis61070.2024.10594473
