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Wafer Surface Semiconductor Defect Classification Using C... | ResearchHub
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Wafer Surface Semiconductor Defect Classification Using Convolution Neural Network Based Improved Faster R-CNN
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Authors
Praveenkumar Babu
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Praveenkumar Babu
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Mohammed Habelalmateen
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•
Neetha Purushotham
Published
May 17, 2024
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Topics
Computer Science
Materials Science
Mathematics
Engineering
Artificial Intelligence
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DOI
10.1109/icdsis61070.2024.10594305
