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Automated Sample Drift Correction for Low Intensity Elect... | ResearchHub
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Automated Sample Drift Correction for Low Intensity Electron Counted TEM Images
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Authors
Polina Burmistrova
5 more
Polina Burmistrova
•
Xiaohui Qu
3 more
•
Dmitri Zakharov
Published
July 1, 2024
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Journal
Microscopy and Microanalysis
Topics
Physics
Materials Science
Optics
Nuclear Physics
Structural Biology
Show all topics
DOI
10.1093/mam/ozae044.1020
