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Anisotropic Correction of Beam-induced Motion for Improve... | ResearchHub
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Anisotropic Correction of Beam-induced Motion for Improved Single-particle Electron Cryo-microscopy
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Authors
Sijie Zheng
4 more
Sijie Zheng
•
Eugene Palovcak
2 more
•
David Agard
Published
July 4, 2016
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Topics
Biology
Materials Science
Computer Science
Physics
Artificial Intelligence
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DOI
10.1101/061960
License
CC-BY-NC-ND
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Supporters
Support the authors with ResearchCoin
Tip RSC
Preprint Server
Topics
Biology
Materials Science
Computer Science
Physics
Artificial Intelligence
Show all topics
DOI
10.1101/061960
License
CC-BY-NC-ND
Other Formats
PDF
