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4D STEM in SEM with a Fast Pixelated Direct Detector | ResearchHub
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4D STEM in SEM with a Fast Pixelated Direct Detector
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Authors
Martin Huth
5 more
Martin Huth
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B Eckert
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•
H. Soltau
Published
July 1, 2024
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Journal
Microscopy and Microanalysis
Topics
Physics
Materials Science
Optics
Surfaces, Coatings And Films
Structural Biology
Show all topics
DOI
10.1093/mam/ozae044.316
