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An Advanced Smart Counting Mode for Pixelated Direct Electron Detectors Based on Semiconductors
Radiation
Nuclear And High Energy Physics
Electrical And Electronic Engineering
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Authors
B Eckert
,
Stefan Aschauer
Martin Huth
,
Peter Majewski
,
H. Soltau
+3 authors
,
L. Strüder
Journal
Microscopy and Microanalysis
Published
Jul 1, 2024
DOI
10.1093/mam/ozae044.197
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