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4D STEM and EELS Acquired Simultaneously with a Fast Pixe... | ResearchHub
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4D STEM and EELS Acquired Simultaneously with a Fast Pixelated Direct Detector with Center Hole
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Authors
Martin Huth
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Martin Huth
•
Valentin Kroner
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•
H. Soltau
Published
July 1, 2024
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Journal
Microscopy and Microanalysis
Topics
Physics
Materials Science
Chemistry
Optics
Nuclear And High Energy Physics
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DOI
10.1093/mam/ozae044.129
