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P‐13: Excessive Oxygen induced Threshold Voltage Shifts i... | ResearchHub
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P‐13: Excessive Oxygen induced Threshold Voltage Shifts in High Mobility Top‐Gate PrIZO TFTs
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Authors
Yuhua Dong
9 more
Yuhua Dong
•
Shi‐Min Ge
7 more
•
Juncheng Xiao
Published
June 1, 2024
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Journal
SID Symposium Digest of Technical Papers
Topics
Chemistry
Materials Science
Engineering
Organic Chemistry
Electrical And Electronic Engineering
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DOI
10.1002/sdtp.17812
