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Enhanced Semiconductor Wafer Defect Classification with C... | ResearchHub
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Enhanced Semiconductor Wafer Defect Classification with CNN and SVM
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Authors
Vishal Yadav
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Vishal Yadav
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Deepak Banerjee
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Vijay Singh
Published
July 26, 2024
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Topics
Computer Science
Materials Science
Artificial Intelligence
Industrial And Manufacturing Engineering
Electrical And Electronic Engineering
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DOI
10.1109/apcit62007.2024.10673497
