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Computed tomography for dimensional metrology | ResearchHub
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Computed tomography for dimensional metrology
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Authors
Jean‐Pierre Kruth
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Jean‐Pierre Kruth
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Markus Bartscher
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Albert Weckenmann
Published
January 1, 2011
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Journal
CIRP Annals
Topics
Computer Science
Artificial Intelligence
Mathematics
Physics
Engineering
Show all topics
DOI
10.1016/j.cirp.2011.05.006
