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Machine Learning for the Recognition of Defects on the Su... | ResearchHub
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Machine Learning for the Recognition of Defects on the Surface of Film Capacitors
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Authors
Akira Narita
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Akira Narita
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Teppei Shibata
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Eduardo Carabez
Published
July 2, 2024
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Topics
Computer Science
Materials Science
Engineering
Artificial Intelligence
Mechanical Engineering
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DOI
10.1109/compsac61105.2024.00197
