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Evaluation of single-crystal X-ray diffraction data from ... | ResearchHub
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Evaluation of single-crystal X-ray diffraction data from a position-sensitive detector
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Authors
Wolfgang Kabsch
Wolfgang Kabsch
Published
December 1, 1988
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Journal
Journal of Applied Crystallography
Topics
Computer Science
Optics
Mathematics
Physics
Economics
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DOI
10.1107/s0021889888007903
