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Accurate determination of local defocus and specimen tilt... | ResearchHub
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Accurate determination of local defocus and specimen tilt in electron microscopy
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Authors
Joseph Mindell
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Joseph Mindell
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Nikolaus Grigorieff
Published
May 13, 2003
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Journal
Journal of Structural Biology
Topics
Computer Science
Materials Science
Mathematics
Physics
Artificial Intelligence
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DOI
10.1016/s1047-8477(03)00069-8
