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A 90-nm logic technology featuring strained-silicon | ResearchHub
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A 90-nm logic technology featuring strained-silicon
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Authors
Scott Thompson
36 more
Scott Thompson
•
M Armstrong
34 more
•
Y.A. El-Mansy
Published
October 26, 2004
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Journal
IEEE Transactions on Electron Devices
Topics
Engineering
Materials Science
Electrical And Electronic Engineering
Biomedical Engineering
Stress (Linguistics)
Show all topics
DOI
10.1109/ted.2004.836648
