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<title>Laterally modulated excitation microscopy: i... | ResearchHub

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Journal

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Topics

Computer Science

Materials Science

Artificial Intelligence

Quantum Mechanics

DOI

10.1117/12.336833

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<title>Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating</title>

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Authors

Rainer Heintzmann

Rainer Heintzmann•Christoph Cremer

Published

January 19, 1999

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Journal

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Topics

Computer Science

Materials Science

Artificial Intelligence

Quantum Mechanics

DOI

10.1117/12.336833