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Applied AI in Defect Detection for Additive Manufacturing... | ResearchHub
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Applied AI in Defect Detection for Additive Manufacturing: Current Literature, Metrics, Datasets, and Open Challenges
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Authors
Youcef Djenouri
2 more
Youcef Djenouri
•
Gautam Srivastava
•
Jerry Lin
Published
May 28, 2024
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Journal
IEEE Instrumentation & Measurement Magazine
Topics
Computer Science
Artificial Intelligence
Engineering
Automotive Engineering
Mechanical Engineering
Show all topics
DOI
10.1109/mim.2024.10540405
