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Unique Thickness-Dependent Properties of the van der Waal... | ResearchHub
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Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet MnBi2Te4 Films
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Authors
M. Otrokov
9 more
M. Otrokov
•
Igor Rusinov
7 more
•
Eugene Chulkov
Published
March 13, 2019
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Journal
Physical Review Letters
Topics
Mathematics
Materials Science
Physics
Quantum Mechanics
Materials Chemistry
Show all topics
DOI
10.1103/physrevlett.122.107202
License
CC-BY
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PDF
Supporters
Support the authors with ResearchCoin
Tip RSC
Journal
Physical Review Letters
Topics
Mathematics
Materials Science
Physics
Quantum Mechanics
Materials Chemistry
Show all topics
DOI
10.1103/physrevlett.122.107202
License
CC-BY
Other Formats
PDF
