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AFM–IR: Combining Atomic Force Microscopy and Infrared Sp... | ResearchHub
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AFM–IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization
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Authors
Alexandre Dazzi
6 more
Alexandre Dazzi
•
Qichi Hu
4 more
•
Curtis Marcott
Published
December 1, 2012
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Journal
Applied Spectroscopy
Topics
Physics
Materials Science
Chemistry
Quantum Mechanics
Optics
Show all topics
DOI
10.1366/12-06804
