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Comparison of calibration methods for atomic-force micros... | ResearchHub
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Comparison of calibration methods for atomic-force microscopy cantilevers
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Authors
N. Burnham
7 more
N. Burnham
•
George Matei
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•
Saul Tendler
Published
December 4, 2002
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Journal
Nanotechnology
Topics
Physics
Materials Science
Quantum Mechanics
Optics
Atomic And Molecular Physics, And Optics
Show all topics
DOI
10.1088/0957-4484/14/1/301
