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Analysis of the charge pumping technique and its applicat... | ResearchHub
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Analysis of the charge pumping technique and its application for the evaluation of MOSFET degradation
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Authors
Paul Heremans
3 more
Paul Heremans
•
J. Witters
1 more
•
H.E. Maes
Published
July 1, 1989
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Journal
IEEE Transactions on Electron Devices
Topics
Biology
Ecology
Computer Science
Physics
Chemistry
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DOI
10.1109/16.30938
