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Electronic Properties and Metrology Applications of the D... | ResearchHub
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Electronic Properties and Metrology Applications of the DiamondNV−Center under Pressure
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Authors
Hiroshi Abe
10 more
Hiroshi Abe
•
Viktor Struzhkin
8 more
•
S. Prawer
Published
January 31, 2014
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Journal
Physical Review Letters
Topics
Physics
Materials Science
Chemistry
Quantum Mechanics
Geophysics
Show all topics
DOI
10.1103/physrevlett.112.047601
Other Formats
PDF
Supporters
Support the authors with ResearchCoin
Tip RSC
Journal
Physical Review Letters
Topics
Physics
Materials Science
Chemistry
Quantum Mechanics
Geophysics
Show all topics
DOI
10.1103/physrevlett.112.047601
Other Formats
PDF
