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High-resolution soft X-ray beamline ADRESS at the Swiss L... | ResearchHub
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High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies
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Authors
Vladimir Strocov
13 more
Vladimir Strocov
•
Thorsten Schmitt
11 more
•
L. Patthey
Published
July 9, 2010
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Journal
Journal of Synchrotron Radiation
Topics
Physics
Optics
Radiation
Surfaces, Coatings And Films
Condensed Matter Physics
Show all topics
DOI
10.1107/s0909049510019862
License
CC-BY
Other Formats
PDF
Supporters
Support the authors with ResearchCoin
Tip RSC
Journal
Journal of Synchrotron Radiation
Topics
Physics
Optics
Radiation
Surfaces, Coatings And Films
Condensed Matter Physics
Show all topics
DOI
10.1107/s0909049510019862
License
CC-BY
Other Formats
PDF