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An experimental study of data retention behavior in moder... | ResearchHub
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An experimental study of data retention behavior in modern DRAM devices
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Authors
Jamie Liu
4 more
Jamie Liu
•
Chris Wilkerson
2 more
•
Onur Mutlu
Published
June 23, 2013
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Topics
Computer Science
Engineering
Electrical And Electronic Engineering
Computer Networks And Communications
Voltage
Show all topics
DOI
10.1145/2485922.2485928
