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On-machine and in-process surface metrology for precision... | ResearchHub
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On-machine and in-process surface metrology for precision manufacturing
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Authors
Wei Gao
6 more
Wei Gao
•
Han Haitjema
4 more
•
Jean‐Marc Linares
Published
January 1, 2019
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Journal
CIRP Annals
Topics
Computer Science
Software Engineering
Mathematics
Engineering
Mechanical Engineering
Show all topics
DOI
10.1016/j.cirp.2019.05.005
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Supporters
Support the authors with ResearchCoin
Tip RSC
Journal
CIRP Annals
Topics
Computer Science
Software Engineering
Mathematics
Engineering
Mechanical Engineering
Show all topics
DOI
10.1016/j.cirp.2019.05.005
Other Formats
PDF
