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In-depth resolved Raman scattering analysis for the ident... | ResearchHub
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In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications
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Authors
Xavier Fontané
8 more
Xavier Fontané
•
Víctor Izquierdo‐Roca
6 more
•
Susanne Siebentritt
Published
May 2, 2011
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Journal
Applied Physics Letters
Topics
Physics
Materials Science
Chemistry
Quantum Mechanics
Optics
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DOI
10.1063/1.3587614