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A study on the high mobility and improved reliability of ... | ResearchHub
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A study on the high mobility and improved reliability of Pr-doped indium zinc oxide thin film transistors
0
Authors
Juncheng Xiao
10 more
Juncheng Xiao
•
Shi‐Min Ge
8 more
•
Shengdong Zhang
Published
June 5, 2024
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Journal
Semiconductor Science and Technology
Topics
Physics
Materials Science
Engineering
Quantum Mechanics
Materials Chemistry
Show all topics
DOI
10.1088/1361-6641/ad5465
License
CC-BY-NC-ND
Other Formats
PDF
Supporters
Support the authors with ResearchCoin
Tip RSC
Journal
Semiconductor Science and Technology
Topics
Physics
Materials Science
Engineering
Quantum Mechanics
Materials Chemistry
Show all topics
DOI
10.1088/1361-6641/ad5465
License
CC-BY-NC-ND
Other Formats
PDF