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Modeling of HCI effect in nFinFET for circuit reliability... | ResearchHub
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Modeling of HCI effect in nFinFET for circuit reliability simulation
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Authors
Jun Zhang
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Jun Zhang
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Bo Liu
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Qingwei Zhang
Published
November 5, 2024
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Journal
Microelectronics Reliability
Topics
Computer Science
Physics
Engineering
Electrical And Electronic Engineering
Reliability Engineering
Show all topics
DOI
10.1016/j.microrel.2024.115543
