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A 45 nm Resilient Microprocessor Core for Dynamic Variati... | ResearchHub
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A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance
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Authors
Keith Bowman
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Keith Bowman
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James Tschanz
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Vivek De
Published
December 10, 2010
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Journal
IEEE Journal of Solid-State Circuits
Topics
Computer Science
Engineering
Hardware And Architecture
Electrical And Electronic Engineering
Embedded System
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DOI
10.1109/jssc.2010.2089657
