Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials
Authors
Jaewoo Shim,
Sang-Hoon BaeWei Kong,
Doyoon Lee,
Kuan Qiao,
Daniel Nezich,
Yong Park,
Ruike Zhao,
Suresh Sundaram,
Xin Li,
Han-Wool Yeon,
Chanyeol Choi,
Hyun Kum,
Ruoyu Yue,
Guanyu Zhou,
Yunbo Ou,
Kyusang Lee,
Jagadeesh Moodera,
Xuanhe Zhao,
Jong‐Hyun Ahn,
Christopher Hinkle,
A. Ougazzaden +20 authors
,
Jeehwan Kim Tip Tip