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Enhancing prediction accuracy of grain yield in wheat lin... | ResearchHub
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Enhancing prediction accuracy of grain yield in wheat lines adapted to the southeastern United States through multivariate and multi‐environment genomic prediction models incorporating spectral and thermal information
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Authors
Jordan McBreen
19 more
Jordan McBreen
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Md Babar
17 more
•
David Sanford
Published
November 19, 2024
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Journal
The Plant Genome
Topics
Biology
Machine Learning
Computer Science
Mathematics
Artificial Intelligence
Show all topics
DOI
10.1002/tpg2.20532
License
CC-BY-NC-ND
Supporters
Support the authors with ResearchCoin
Tip RSC
Journal
The Plant Genome
Topics
Biology
Machine Learning
Computer Science
Mathematics
Artificial Intelligence
Show all topics
DOI
10.1002/tpg2.20532
License
CC-BY-NC-ND