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Enhancing Total-Ionizing-Dose Effects in the Partial Insu... | ResearchHub
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Enhancing Total-Ionizing-Dose Effects in the Partial Insulator in a Buried-Channel-Array Transistor: A Structural Proposal and Analytical Approach
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Authors
Je Park
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Je Park
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Dong-Keun Kim
13 more
•
Myoung Lee
Published
January 1, 2024
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Journal
IEEE Transactions on Device and Materials Reliability
Topics
Physics
Materials Science
Engineering
Nuclear Physics
Electrical And Electronic Engineering
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DOI
10.1109/tdmr.2024.3503576
