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Defects in polysilicon channel: Insight from first princi... | ResearchHub
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Defects in polysilicon channel: Insight from first principles and multi-scale modelling
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Authors
Rita Maji
7 more
Rita Maji
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Tommaso Rollo
5 more
•
Milan Pešić
Published
November 1, 2024
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Journal
Solid-State Electronics
Topics
Computer Science
Materials Science
Engineering
Electrical And Electronic Engineering
Gate Oxide
Show all topics
DOI
10.1016/j.sse.2024.109031
License
CC-BY
Supporters
Support the authors with ResearchCoin
Tip RSC
Journal
Solid-State Electronics
Topics
Computer Science
Materials Science
Engineering
Electrical And Electronic Engineering
Gate Oxide
Show all topics
DOI
10.1016/j.sse.2024.109031
License
CC-BY
