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Substrate and finite-thickness-induced uncertainties in s... | ResearchHub
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Substrate and finite-thickness-induced uncertainties in surface impedance measurements of thin conducting films
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Authors
Nicola Pompeo
4 more
Nicola Pompeo
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Andrea Alimenti
2 more
•
Enrico Silva
Published
January 1, 2024
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Journal
IEEE Transactions on Instrumentation and Measurement
Topics
Physics
Materials Science
Engineering
Bioengineering
Electrical And Electronic Engineering
Show all topics
DOI
10.1109/tim.2024.3509590
License
CC-BY
Supporters
Support the authors with ResearchCoin
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Journal
IEEE Transactions on Instrumentation and Measurement
Topics
Physics
Materials Science
Engineering
Bioengineering
Electrical And Electronic Engineering
Show all topics
DOI
10.1109/tim.2024.3509590
License
CC-BY
