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Substrate and finite-thickness-induced uncertainties in surface impedance measurements of thin conducting films
Geology
Oceanography
Electrical And Electronic Engineering
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Authors
Nicola Pompeo
,
Andrea Alimenti
Kostiantyn Torokhtii
,
Pablo García
+2 authors
,
Enrico Silva
Journal
IEEE Transactions on Instrumentation and Measurement
Published
Jan 1, 2024
DOI
10.1109/tim.2024.3509590
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