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Spectroscopic metrics allow in situ measurement of mean s... | ResearchHub
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Spectroscopic metrics allow in situ measurement of mean size and thickness of liquid-exfoliated few-layer graphene nanosheets
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Authors
Claudia Backes
9 more
Claudia Backes
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Keith Paton
7 more
•
Jonathan Coleman
Published
January 1, 2016
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Journal
Nanoscale
Topics
Physics
Materials Science
Chemistry
Quantum Mechanics
Optics
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DOI
10.1039/c5nr08047a
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Supporters
Support the authors with ResearchCoin
Tip RSC
Journal
Nanoscale
Topics
Physics
Materials Science
Chemistry
Quantum Mechanics
Optics
Show all topics
DOI
10.1039/c5nr08047a
Other Formats
PDF