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Evaluation of Space Radiation Effects on FinFET oxide layer with Geant4 Simulation
Radiation
Electrical And Electronic Engineering
Computer Science
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Authors
Jianyu Zhang
,
Hua Yang
Sichong Huang
,
Tongde Li
,
Liang Wang
,
Xing Zhang
+4 authors
,
Yuanfu Zhao
Journal
Microelectronics Journal
Published
Dec 1, 2024
DOI
10.1016/j.mejo.2024.106520
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