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Evaluation of Space Radiation Effects on FinFET oxide lay... | ResearchHub
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Evaluation of Space Radiation Effects on FinFET oxide layer with Geant4 Simulation
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Authors
Jianyu Zhang
6 more
Jianyu Zhang
•
Hua Yang
4 more
•
Yuanfu Zhao
Published
December 1, 2024
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Journal
Microelectronics Journal
Topics
Computer Science
Materials Science
Physics
Optics
Nuclear Physics
Show all topics
DOI
10.1016/j.mejo.2024.106520
