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Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines
Artificial Intelligence
Software
Machine Learning
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Authors
Christopher Henard
,
Mike Papadakis
Gilles Perrouin
,
Jacques Klein
,
Patrick Heymans
+3 authors
,
Yves Traon
Journal
IEEE Transactions on Software Engineering
Published
May 29, 2014
DOI
10.1109/tse.2014.2327020
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