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Improving distribution system state estimation: novel metadata driven approach for pseudo measurement generation
Artificial Intelligence
Electrical And Electronic Engineering
Safety, Risk, Reliability And Quality
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Authors
Steven Storch
,
Daniel Fendt
Michael Finkel
,
Martin Uhrig
,
Michael Kreißl
+3 authors
,
Lothar Behringer
Journal
IET conference proceedings.
Published
Jan 1, 2025
DOI
10.1049/icp.2024.1968
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