Abstract

A detailed characterization of the impact of a RbF post-deposition treatment (RbF-PDT) on the chemical structure of a wide-gap Cu(In, Ga)Se2 thin-film solar cell absorber surface with a high Ga/(Ga + In) (GGI) ratio of 0.9 is presented. Using synchrotron- and lab-based x-ray photoelectron spectroscopy, as well as x-ray-excited Auger electron spectroscopy, we observe distinct differences to RbF-PDT on absorber surfaces with the common GGI of ∼0.3. In particular, RbF-PDT reduces sodium and oxide content at the surface, while the copper concentration at the surface is not affected. We find no spectral evidence for the formation of a distinct Rb–In–Se surface layer. In addition, we observe that the GGI ratio at the surface is slightly decreased due to a reduction of the Ga and an increase in the In concentration, which may explain the observed improvement in the power conversion efficiency after the PDT (from 6.8% to 7.3%).