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Integrated DC arc model and DC arc detection approach based on K‐line diagram and spectrum integral difference
Electrical And Electronic Engineering
Radiological And Ultrasound Technology
Statistics, Probability And Uncertainty
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Authors
Qing Xiong
,
Junyi Zhang
Jianghan Li
,
Yijie Tang
,
Yi Zhuang
,
Yanjie Cui
,
Rui Li
+5 authors
,
Shengchang Ji
Journal
IET Power Electronics
Published
Jan 1, 2025
DOI
10.1049/pel2.12849
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