In this work, we systematically investigate low-temperature polycrystalline silicon (LTPS)-based driving circuits of electronic paper for the aim of adopting small width/length ratio (W/L) of LTPS-based thin film transistors (TFTs) to reduce switch error and thus improve image sticking. Firstly, LTPS-TFTs with extremely low off-state leakage current (IOFF) even at a large source-drain voltage (VDS) of 30 V were obtained through detailed explorations of LTPS process technology. Meanwhile, the high on-state current (ION) of LTPS-TFTs also meet the requirements of fast signal writing to the storage capacitor due to their extremely high field-effect mobility (approximately 100 cm2/V⋅s), making it possible to fabricate TFTs with relatively small W/L, thereby minimizing switch error. The ID-VD test results reveal that the produced LTPS-TFTs can effectively withstand the maximum voltage difference of 30 V during product operation. Subsequently, the optimal W/L of the LTPS-TFT was determined through experimental results. Then, reliability test was conducted on the obtained LTPS-TFTs, revealing that the threshold voltage (VTH) of the LTPS-TFTs shifted by 0.08 V after 7200 s under negative bias temperature stress (NBTS), and only by 0.19 V under positive bias temperature stress (PBTS). The aging test results of the aforementioned LTPS-TFTs exhibits a new physical phenomenon, that is, the IOFF of the LTPS-TFTs has a strict matching characteristic with the aging direction. Next, we proposed a novel 2T2C driving circuit for the e-paper, which can effectively avoid the adverse effects of IOFF on the frame holding period, and plotted it into an array layout. Finally, we combined the optimal fabricating process of the LTPS-TFTs with the 2T2C driving circuit design scheme to produce an e-paper with outstanding image sticking performance.